"Multi-spectra glasses" for scanning electron microscopy
Berlin, Germany (SPX) Oct 07, 2014 - Reflection zone plates produced by HZB enable lighter elements in material samples to be precisely detected using scanning electron microscopy (SEM) by providing high resolution in the range of 50-1120 eV. The scanning electron microscope is not only used for precisely surveying the surface topology of samples, but also for determining their chemical compositions. This is done by exciting ... more
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