Friday, 10 October 2014

NIST quantum probe enhances electric field measurements

CHIP TECH
NIST quantum probe enhances electric field measurements
Washington DC (SPX) Oct 10, 2014 - Researchers at the National Institute of Standards and Technology (NIST) and the University of Michigan have demonstrated a technique based on the quantum properties of atoms that directly links measurements of electric field strength to the International System of Units (SI).* The new method could improve the sensitivity, precision and ease of tests and calibrations of antennas, sensors, ... more


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