New model clarifies photoexcited thin-film lattice dynamics
Washington DC (SPX) Nov 19, 2014 - A research team from Germany developed an analytical model to describe the structural dynamics of photoexcited thin films and verified it by ultrafast X-ray diffraction. Lattice dynamics, atomic movements in a crystal structure, can influence the physical and chemical properties of a material. The phenomenon can be directly studied using ultrafast X-ray diffraction, in which femtosecond X- ... more
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