ORNL microscopy pencils patterns in polymers at the nanoscale

ORNL microscopy pencils patterns in polymers at the nanoscale
Oak Ridge TE (SPX) Dec 18, 2014 - Scientists at the Department of Energy's Oak Ridge National Laboratory have used advanced microscopy to carve out nanoscale designs on the surface of a new class of ionic polymer materials for the first time. The study provides new evidence that atomic force microscopy, or AFM, could be used to precisely fabricate materials needed for increasingly smaller devices. Polymerized ionic liquids ... more

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